Test as written was to allow for having to swap caps and repeat tests without any real hope of having it work.
Feedback presented to that end gave an idea of the time required for repeat runs as needed so you could set a timer and come back.
Feedback and operation were specifically done for somebody not understanding the code.
Now that results are showing much better than the long wired attempt here it can be further refined knowing it can work.
It worked as needed and written to find that first really big range of usable CAP values.
In fact as noted having it run by
@Dogbone06 and seeing one result I knew it was not running write as built because of an IDE setting showing the results were unusable.
Modification of the results is almost trivial ... hardly worth the repeat negative lengthy pounding on it, it seems to get about 4 times now after first real use. Very off putting
Something easily constructive and worked with:
Test Result: 0 read errors
Extra info: ran for 2439.02 seconds
Edited to run on power up - giving system spec notes SDRAM and F_CPU speed, then runs FAST test with result for 3 ReReads, proceeds to then run longer 100 ReRead test that will take over 40 minutes and can be allowed to complete if the FAST test shows it is worth waiting.
Now on github:
Code:
EXTMEM Memory Test, 32 Mbyte SDRAM speed 198 Mhz F_CPU_ACTUAL 600 Mhz begin@ 80000000 end@ 82000000
--- START 57 test patterns ------ with 3 reReads ... wait ...
#############............................................
Test result: 0 read errors
Extra info: ran for 85.80 seconds
--- START 57 test patterns ------ with 100 reReads ... wait ...
#############............................................
Test result: 0 read errors
Extra info: ran for 2480.03 seconds
@mjs513 - should be using your prior update for useDQS and without a CAP onboard it was failing until I set this - which seems to contradict the comment as edited?
uint32_t useDQS = true; // "false" if a capacitor is not present on pin EMC_39